Hugh J. Barnaby, Michael L. McLain, Ivan Sanchez Esqueda, Xiao J. Chen. Modeling ionizing radiation effects in solid state materials and CMOS devices. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 273-280, IEEE, 2008. [doi]
Abstract is missing.