Thomas S. Barnett, Adit D. Singh, Victor P. Nelson. Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 326-332, IEEE Computer Society, 2001. [doi]
Abstract is missing.