Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda. A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35µm Technology. In Matteo Sonza Reorda, Ondrej Novák, Bernd Straube, Hana Kubatova, Zdenek Kotásek, Pavel Kubalík, Raimund Ubar, Jiri Bucek, editors, Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006. pages 119-124, IEEE Computer Society, 2006.
Abstract is missing.