Reliability evaluation of a silicon-on-silicon MCM-D package - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

J. Barton, G. McCarthy, R. Doyle, K. Delaney, Enric Cabruja, M. Lozano, A. Collado, J. Santander. Reliability evaluation of a silicon-on-silicon MCM-D package. Microelectronics Reliability, 41(6):887-899, 2001. [doi]

This author has not been identified. Look up 'J. Barton' in GoogleThis author has not been identified. Look up 'G. McCarthy' in GoogleThis author has not been identified. Look up 'R. Doyle' in GoogleThis author has not been identified. Look up 'K. Delaney' in GoogleThis author has not been identified. Look up 'Enric Cabruja' in GoogleThis author has not been identified. Look up 'M. Lozano' in GoogleThis author has not been identified. Look up 'A. Collado' in GoogleThis author has not been identified. Look up 'J. Santander' in Google

runs on WebDSL