J. Barton, G. McCarthy, R. Doyle, K. Delaney, Enric Cabruja, M. Lozano, A. Collado, J. Santander. Reliability evaluation of a silicon-on-silicon MCM-D package. Microelectronics Reliability, 41(6):887-899, 2001. [doi]
@article{BartonMDDCLCS01,
title = {Reliability evaluation of a silicon-on-silicon MCM-D package},
author = {J. Barton and G. McCarthy and R. Doyle and K. Delaney and Enric Cabruja and M. Lozano and A. Collado and J. Santander},
year = {2001},
doi = {10.1016/S0026-2714(01)00014-2},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00014-2},
tags = {reliability},
researchr = {https://researchr.org/publication/BartonMDDCLCS01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {6},
pages = {887-899},
}