A HW/SW Cross-Layer Approach for Determining Application-Redundant Hardware Faults in Embedded Systems

Christian Bartsch, Carlos Villarraga, Dominik Stoffel, Wolfgang Kunz. A HW/SW Cross-Layer Approach for Determining Application-Redundant Hardware Faults in Embedded Systems. J. Electronic Testing, 33(1):77-92, 2017. [doi]

Abstract

Abstract is missing.