VLSI Self-Testing Based on Syndrome Techniques

Zeev Barzilai, Jacob Savir, George Markowsky, Merlin G. Smith. VLSI Self-Testing Based on Syndrome Techniques. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 102-109, IEEE Computer Society, 1981.

Authors

Zeev Barzilai

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Jacob Savir

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George Markowsky

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Merlin G. Smith

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