Zeev Barzilai, Jacob Savir, George Markowsky, Merlin G. Smith. VLSI Self-Testing Based on Syndrome Techniques. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 102-109, IEEE Computer Society, 1981.
@inproceedings{BarzilaiSMS81,
title = {VLSI Self-Testing Based on Syndrome Techniques},
author = {Zeev Barzilai and Jacob Savir and George Markowsky and Merlin G. Smith},
year = {1981},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/BarzilaiSMS81},
cites = {0},
citedby = {0},
pages = {102-109},
booktitle = {Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981},
publisher = {IEEE Computer Society},
}