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Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis

G. Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis. Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. Microelectronics Reliability, 51(9-11):1640-1645, 2011. [doi]

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