Sylvain Dudit - researchr alias

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Viewing Publication 1 - 9 from 9

2011

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysisG. Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis. mr, 51(9-11):1640-1645, 2011. [doi]

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysisGuillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet. mr, 51(9-11):1662-1667, 2011. [doi]

(2×2) matrix ESD power devices for advanced CMOS technologiesPhilippe Galy, J. Bourgeat, J. Jimenez, B. Jacquier, D. Marin-Cudraz, Sylvain Dudit. mr, 51(9-11):1608-1613, 2011. [doi]

Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulationThierry Parrassin, Guillaume Celi, Sylvain Dudit, Michel Vallet. mr, 51(9-11):1646-1651, 2011. [doi]

2010

2009

Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stressPhilippe Galy, Sylvain Dudit, Michel Vallet, C. Richier, Christophe Entringer, F. Jezequel, E. Petit, J. Beltritti. mr, 49(9-11):1107-1110, 2009. [doi]

2004

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis. mr, 44(9-11):1715-1720, 2004. [doi]

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