Philippe Galy, Sylvain Dudit, Michel Vallet, Ph. Larre, M. Bilinski, E. Petit, J. Beltritti, A. Dray, J. Jimenez, F. Jezequel, R. Chevallier, C. Boutonnat, V. Varo. Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies. Microelectronics Reliability, 50(9-11):1388-1392, 2010. [doi]
Abstract is missing.