Philippe Galy, Sylvain Dudit, Michel Vallet, Ph. Larre, M. Bilinski, E. Petit, J. Beltritti, A. Dray, J. Jimenez, F. Jezequel, R. Chevallier, C. Boutonnat, V. Varo. Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies. Microelectronics Reliability, 50(9-11):1388-1392, 2010. [doi]
@article{GalyDVLBPBDJJCBV10,
title = {Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies},
author = {Philippe Galy and Sylvain Dudit and Michel Vallet and Ph. Larre and M. Bilinski and E. Petit and J. Beltritti and A. Dray and J. Jimenez and F. Jezequel and R. Chevallier and C. Boutonnat and V. Varo},
year = {2010},
doi = {10.1016/j.microrel.2010.07.137},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.137},
tags = {C++},
researchr = {https://researchr.org/publication/GalyDVLBPBDJJCBV10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1388-1392},
}