Romain Desplats - researchr alias

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Viewing Publication 1 - 28 from 28

2006

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cardsC. De Nardi, Romain Desplats, Philippe Perdu, J.-L. Gauffier, C. Guérin. mr, 46(9-11):1569-1574, 2006. [doi]

2005

Dynamic Laser Stimulation Case StudiesFelix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte. mr, 45(9-11):1538-1543, 2005. [doi]

Failure analysis of micro-heating elements suspended on thin membranesD. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu. mr, 45(9-11):1786-1789, 2005. [doi]

Oxide charge measurements in EEPROM devicesC. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier. mr, 45(9-11):1514-1519, 2005. [doi]

Light Emission to Time Resolved Emission For IC Debug and Failure AnalysisM. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, D. Lewis, J. Noel, S. Dudit. mr, 45(9-11):1476-1481, 2005. [doi]

NIR laser stimulation for dynamic timing analysisKevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis. mr, 45(9-11):1459-1464, 2005. [doi]

2004

Femtosecond Laser Ablation for Backside Silicon ThinningFelix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu. mr, 44(9-11):1605-1609, 2004. [doi]

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systemsOlivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti. mr, 44(9-11):1559-1563, 2004. [doi]

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injectionsRomain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis. mr, 44(9-11):1709-1714, 2004. [doi]

Time Resolved Photon Emission Processing Flow for IC AnalysisRomain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis. mr, 44(9-11):1655-1662, 2004. [doi]

Automated Diagnosis and Probing Flow for Fast Fault Localization in ICD. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs. mr, 44(9-11):1553-1558, 2004. [doi]

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis. mr, 44(9-11):1715-1720, 2004. [doi]

Implementation of TRE systems into Emission MicroscopesAlberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu. mr, 44(9-11):1529-1534, 2004. [doi]

2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localizationT. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles. mr, 43(3):439-444, 2003. [doi]

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser TestingFelix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis. mr, 43(9-11):1681-1686, 2003. [doi]

Magnetic emission mapping for passive integrated components characterisationO. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina. mr, 43(9-11):1809-1814, 2003. [doi]

Fault Localization using Time Resolved Photon Emission and STIL WaveformsRomain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah. itc 2003: 254-263 [doi]

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD AutochannelingRomain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari. mr, 43(9-11):1663-1668, 2003. [doi]

Time Resolved Photoemission (PICA) - From the Physics to Practical ConsiderationsM. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis. mr, 43(9-11):1639-1644, 2003. [doi]

Solar Cell Analysis with Light Emission and OBIC TechniquesKevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu. mr, 43(9-11):1755-1760, 2003. [doi]

2002

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) DevicesFelix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement. mr, 42(9-11):1581-1585, 2002. [doi]

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus UnbiasedFelix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis. mr, 42(9-11):1729-1734, 2002. [doi]

Backside Hot Spot Detection Using Liquid Crystal MicroscopyO. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis. mr, 42(9-11):1741-1746, 2002. [doi]

IR confocal laser microscopy for MEMS Technological EvaluationDjemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats. mr, 42(9-11):1815-1817, 2002. [doi]

2001

Modeling Thermal Laser StimulationFelix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis. mr, 41(9-10):1477-1482, 2001.

Silicon Thinning and Polishing on Packaged DevicesFelix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis. mr, 41(9-10):1557-1561, 2001.

Backside Localization of Current Leakage Faults Using Thermal Laser StimulationRomain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis. mr, 41(9-10):1539-1544, 2001.

A New Versatile Testing Interface for Failure Analysis in Integrated CircuitsRomain Desplats, Philippe Perdu, Felix Beaudoin. mr, 41(9-10):1495-1499, 2001.

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