Felix Beaudoin - researchr alias

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Viewing Publication 1 - 32 from 32

2007

Dynamic laser stimulation techniques for advanced failure analysis and design debug applicationsFelix Beaudoin, Kevin Sanchez, Philippe Perdu. mr, 47(9-11):1517-1522, 2007. [doi]

2006

Application of various optical techniques for ESD defect localizationF. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis. mr, 46(9-11):1563-1568, 2006. [doi]

2005

Dynamic Laser Stimulation Case StudiesFelix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte. mr, 45(9-11):1538-1543, 2005. [doi]

Failure analysis of micro-heating elements suspended on thin membranesD. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu. mr, 45(9-11):1786-1789, 2005. [doi]

Impact of semiconductors material on IR Laser Stimulation signalAbdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, D. Lewis, Pascal Fouillat. mr, 45(9-11):1465-1470, 2005. [doi]

Oxide charge measurements in EEPROM devicesC. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier. mr, 45(9-11):1514-1519, 2005. [doi]

NIR laser stimulation for dynamic timing analysisKevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis. mr, 45(9-11):1459-1464, 2005. [doi]

2004

Femtosecond Laser Ablation for Backside Silicon ThinningFelix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu. mr, 44(9-11):1605-1609, 2004. [doi]

Time Resolved Photon Emission Processing Flow for IC AnalysisRomain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis. mr, 44(9-11):1655-1662, 2004. [doi]

Understanding the effects of NIR laser stimulation on NMOS transistorAbdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat. mr, 44(9-11):1675-1680, 2004. [doi]

2003

A physical approach on SCOBIC investigation in VLSIT. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto. mr, 43(1):173-177, 2003. [doi]

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localizationT. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles. mr, 43(3):439-444, 2003. [doi]

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser TestingFelix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis. mr, 43(9-11):1681-1686, 2003. [doi]

Magnetic emission mapping for passive integrated components characterisationO. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina. mr, 43(9-11):1809-1814, 2003. [doi]

Fault Localization using Time Resolved Photon Emission and STIL WaveformsRomain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah. itc 2003: 254-263 [doi]

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD AutochannelingRomain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari. mr, 43(9-11):1663-1668, 2003. [doi]

Short defect characterization based on TCR parameter extractionAbdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis. mr, 43(9-11):1563-1568, 2003. [doi]

The advent of MEMS in spaceX. Lafontan, F. Pressecq, Felix Beaudoin, S. Rigo, M. Dardalhon, J. L. Roux, P. Schmitt, J. Kuchenbecker, B. Baradat, D. Lellouchi. mr, 43(7):1061-1083, 2003. [doi]

Time Resolved Photoemission (PICA) - From the Physics to Practical ConsiderationsM. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis. mr, 43(9-11):1639-1644, 2003. [doi]

Solar Cell Analysis with Light Emission and OBIC TechniquesKevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu. mr, 43(9-11):1755-1760, 2003. [doi]

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technologyD. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères. mr, 43(1):71-79, 2003. [doi]

2002

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) DevicesFelix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement. mr, 42(9-11):1581-1585, 2002. [doi]

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus UnbiasedFelix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis. mr, 42(9-11):1729-1734, 2002. [doi]

Backside Hot Spot Detection Using Liquid Crystal MicroscopyO. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis. mr, 42(9-11):1741-1746, 2002. [doi]

Comprehensive failure analysis of leakage faults in bipolar transistorsB. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps. mr, 42(9-11):1449-1452, 2002. [doi]

IR confocal laser microscopy for MEMS Technological EvaluationDjemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats. mr, 42(9-11):1815-1817, 2002. [doi]

A 2.5 Gbit/s CMOS optical receiver frontendPatrick Mitran, Felix Beaudoin, Mourad N. El-Gamal. iscas 2002: 441-444 [doi]

2001

Modeling Thermal Laser StimulationFelix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis. mr, 41(9-10):1477-1482, 2001.

Silicon Thinning and Polishing on Packaged DevicesFelix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis. mr, 41(9-10):1557-1561, 2001.

Backside Localization of Current Leakage Faults Using Thermal Laser StimulationRomain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis. mr, 41(9-10):1539-1544, 2001.

A New Versatile Testing Interface for Failure Analysis in Integrated CircuitsRomain Desplats, Philippe Perdu, Felix Beaudoin. mr, 41(9-10):1495-1499, 2001.

Front Side and Backside OBIT Mappings applied to Single Event Transient TestingD. Lewis, V. Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu. mr, 41(9-10):1471-1476, 2001.

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