Backside Hot Spot Detection Using Liquid Crystal Microscopy

O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis. Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability, 42(9-11):1741-1746, 2002. [doi]

Abstract

Abstract is missing.