Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs. Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectronics Reliability, 44(9-11):1553-1558, 2004. [doi]

Abstract

Abstract is missing.