Robert W. Bassett, Pamela S. Gillis, John J. Shushereba. High-Density CMOS Multichip-Module Testing and Diagnosis. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 530-539, IEEE Computer Society, 1991.
@inproceedings{BassettGS91,
title = {High-Density CMOS Multichip-Module Testing and Diagnosis},
author = {Robert W. Bassett and Pamela S. Gillis and John J. Shushereba},
year = {1991},
tags = {testing},
researchr = {https://researchr.org/publication/BassettGS91},
cites = {0},
citedby = {0},
pages = {530-539},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}