Robert W. Bassett, Pamela S. Gillis, John J. Shushereba. High-Density CMOS Multichip-Module Testing and Diagnosis. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 530-539, IEEE Computer Society, 1991.
Abstract is missing.