Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir. Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
Abstract is missing.