Embedded X86 testing methodology

Luis Basto, Asif Khan, Pete Hodakievic. Embedded X86 testing methodology. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 487-492, IEEE Computer Society, 1999.

Authors

Luis Basto

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Asif Khan

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Pete Hodakievic

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