Luis Basto, Asif Khan, Pete Hodakievic. Embedded X86 testing methodology. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 487-492, IEEE Computer Society, 1999.
@inproceedings{BastoKH99,
title = {Embedded X86 testing methodology},
author = {Luis Basto and Asif Khan and Pete Hodakievic},
year = {1999},
tags = {testing},
researchr = {https://researchr.org/publication/BastoKH99},
cites = {0},
citedby = {0},
pages = {487-492},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}