Kanad Basu, Prabhat Mishra. A novel test-data compression technique using application-aware bitmask and dictionary selection methods. In Vijay Narayanan, Zhiyuan Yan, Enrico Macii, Sanjukta Bhanja, editors, Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008. pages 83-88, ACM, 2008. [doi]
Abstract is missing.