Kanad Basu, Prabhat Mishra, Priyadarsan Patra. Efficient combination of trace and scan signals for post silicon validation and debug. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-8, IEEE, 2011. [doi]
Abstract is missing.