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A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation

Nidhi Batra, Shashwat Kaushik, Anil Kumar Gundu, Mohammad S. Hashmi, G. S. Visweswaran, Anuj Grover. A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation. In Karan S. Bhatia, Massimo Alioto, Danella Zhao, Andrew Marshall, Ramalingam Sridhar, editors, 29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016. pages 47-51, IEEE, 2016. [doi]

Authors

Nidhi Batra

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Shashwat Kaushik

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Anil Kumar Gundu

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Mohammad S. Hashmi

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G. S. Visweswaran

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Anuj Grover

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