Nidhi Batra, Shashwat Kaushik, Anil Kumar Gundu, Mohammad S. Hashmi, G. S. Visweswaran, Anuj Grover. A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation. In Karan S. Bhatia, Massimo Alioto, Danella Zhao, Andrew Marshall, Ramalingam Sridhar, editors, 29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016. pages 47-51, IEEE, 2016. [doi]
@inproceedings{BatraKGHVG16,
title = {A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation},
author = {Nidhi Batra and Shashwat Kaushik and Anil Kumar Gundu and Mohammad S. Hashmi and G. S. Visweswaran and Anuj Grover},
year = {2016},
doi = {10.1109/SOCC.2016.7905432},
url = {http://dx.doi.org/10.1109/SOCC.2016.7905432},
researchr = {https://researchr.org/publication/BatraKGHVG16},
cites = {0},
citedby = {0},
pages = {47-51},
booktitle = {29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016},
editor = {Karan S. Bhatia and Massimo Alioto and Danella Zhao and Andrew Marshall and Ramalingam Sridhar},
publisher = {IEEE},
isbn = {978-1-5090-1367-8},
}