Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs

Niccolò Battezzati, Filomena Decuzzi, Massimo Violante, Michel Briet. Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 89-94, IEEE, 2009. [doi]

Authors

Niccolò Battezzati

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Filomena Decuzzi

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Massimo Violante

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Michel Briet

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