Niccolò Battezzati, Filomena Decuzzi, Massimo Violante, Michel Briet. Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 89-94, IEEE, 2009. [doi]
@inproceedings{BattezzatiDVB09,
title = {Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs},
author = {Niccolò Battezzati and Filomena Decuzzi and Massimo Violante and Michel Briet},
year = {2009},
doi = {10.1109/IOLTS.2009.5195988},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5195988},
tags = {analysis},
researchr = {https://researchr.org/publication/BattezzatiDVB09},
cites = {0},
citedby = {0},
pages = {89-94},
booktitle = {15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal},
publisher = {IEEE},
isbn = {978-1-4244-4596-7},
}