Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante. On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 135-140, IEEE, 2008. [doi]
Abstract is missing.