Christian Bauckhage, Jannik Fritsch, Gerhard Sagerer. Memorizing Visual Knowledge for Assembly Process Monitoring. In Bernd Radig, Stefan Florczyk, editors, Pattern Recognition, 23rd DAGM-Symposium, Munich, Germany, September 12-14, 2001, Proceedings. Volume 2191 of Lecture Notes in Computer Science, pages 178-185, Springer, 2001. [doi]
Abstract is missing.