Measuring and Improving Design Patterns Testability - researchr publication authors

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Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel. Measuring and Improving Design Patterns Testability. In 9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia. pages 50, IEEE Computer Society, 2003. [doi]

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Benoit Baudry

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Yves Le Traon

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Jean-Marc Jézéquel

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