Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel. Measuring and Improving Design Patterns Testability. In 9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia. pages 50, IEEE Computer Society, 2003. [doi]
@inproceedings{BaudryTSJ03,
title = {Measuring and Improving Design Patterns Testability},
author = {Benoit Baudry and Yves Le Traon and Gerson Sunyé and Jean-Marc Jézéquel},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/metrics/2003/1987/00/19870050abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/BaudryTSJ03},
cites = {0},
citedby = {0},
pages = {50},
booktitle = {9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia},
publisher = {IEEE Computer Society},
isbn = {0-7695-1987-3},
}