Asad Amin Bawa, Muhammad Tauseef Rab, Nur A. Touba. Efficient compression of x-masking control data via dynamic channel allocation. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 125-130, IEEE, 2013. [doi]
Abstract is missing.