Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues - researchr publication authors

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Ismet Bayraktaroglu, Jim Hunt, Daniel Watkins. Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-7, IEEE, 2006. [doi]

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