Ismet Bayraktaroglu, Jim Hunt, Daniel Watkins. Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-7, IEEE, 2006. [doi]
@inproceedings{BayraktarogluHW06,
title = {Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues},
author = {Ismet Bayraktaroglu and Jim Hunt and Daniel Watkins},
year = {2006},
doi = {10.1109/TEST.2006.297675},
url = {http://dx.doi.org/10.1109/TEST.2006.297675},
researchr = {https://researchr.org/publication/BayraktarogluHW06},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006},
editor = {Scott Davidson and Anne Gattiker},
publisher = {IEEE},
isbn = {1-4244-0292-1},
}