Deterministic partitioning techniques for fault diagnosis in scan-based BIST - researchr publication authors

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Ismet Bayraktaroglu, Alex Orailoglu. Deterministic partitioning techniques for fault diagnosis in scan-based BIST. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 273-282, IEEE Computer Society, 2000.

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