Ismet Bayraktaroglu, Alex Orailoglu. Deterministic partitioning techniques for fault diagnosis in scan-based BIST. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 273-282, IEEE Computer Society, 2000.
@inproceedings{BayraktarogluO00,
title = {Deterministic partitioning techniques for fault diagnosis in scan-based BIST},
author = {Ismet Bayraktaroglu and Alex Orailoglu},
year = {2000},
tags = {rule-based, partitioning},
researchr = {https://researchr.org/publication/BayraktarogluO00},
cites = {0},
citedby = {0},
pages = {273-282},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}