Improved Methods for Fault Diagnosis in Scan-Based BIST

Ismet Bayraktaroglu, Alex Orailoglu. Improved Methods for Fault Diagnosis in Scan-Based BIST. In 2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001. pages 169-172, IEEE, 2001.

Abstract

Abstract is missing.