Ismet Bayraktaroglu, Alex Orailoglu. Gate Level Fault Diagnosis in Scan-Based BIST. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 376-381, IEEE Computer Society, 2002. [doi]
@inproceedings{BayraktarogluO02,
title = {Gate Level Fault Diagnosis in Scan-Based BIST},
author = {Ismet Bayraktaroglu and Alex Orailoglu},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/date/2002/1471/00/14710376abs.htm},
tags = {rule-based},
researchr = {https://researchr.org/publication/BayraktarogluO02},
cites = {0},
citedby = {0},
pages = {376-381},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1471-5},
}