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Ismet Bayraktaroglu, Alex Orailoglu. Gate Level Fault Diagnosis in Scan-Based BIST. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 376-381, IEEE Computer Society, 2002. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Improved Methods for Fault Diagnosis in Scan-Based BISTIsmet Bayraktaroglu, Alex Orailoglu. latw 2001: 169-172 Improved fault diagnosis in scan-based BIST via superpositionIsmet Bayraktaroglu, Alex Orailoglu. dac 2000: 55-58 [doi] Deterministic partitioning techniques for fault diagnosis in scan-based BISTIsmet Bayraktaroglu, Alex Orailoglu. itc 2000: 273-282
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