Ismet Bayraktaroglu, Alex Orailoglu. Decompression Hardware Determination for Test Volume and Time Reduction through Unified Test Pattern Compaction and Compression. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 113-120, IEEE Computer Society, 2003. [doi]
@inproceedings{BayraktarogluO03, title = {Decompression Hardware Determination for Test Volume and Time Reduction through Unified Test Pattern Compaction and Compression}, author = {Ismet Bayraktaroglu and Alex Orailoglu}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/vts/2003/1924/00/19240113abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/BayraktarogluO03}, cites = {0}, citedby = {0}, pages = {113-120}, booktitle = {21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1924-5}, }