J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca. i::DD:: Pulse Response Testing Applied to Complex CMOS ICs. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 32-39, IEEE Computer Society, 1997.
@inproceedings{BeasleyPHRA97,
title = {i::DD:: Pulse Response Testing Applied to Complex CMOS ICs},
author = {J. S. Beasley and S. Pour-Mozafari and D. Huggett and Alan W. Righter and C. J. Apodaca},
year = {1997},
tags = {testing, C++},
researchr = {https://researchr.org/publication/BeasleyPHRA97},
cites = {0},
citedby = {0},
pages = {32-39},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}