J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca. i::DD:: Pulse Response Testing Applied to Complex CMOS ICs. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 32-39, IEEE Computer Society, 1997.
Abstract is missing.