Bernd Becker, Rolf Drechsler. Testability of Circuits Derived from Functional Decision Diagrams. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 667, IEEE Computer Society, 1994.
@inproceedings{BeckerD94,
title = {Testability of Circuits Derived from Functional Decision Diagrams},
author = {Bernd Becker and Rolf Drechsler},
year = {1994},
tags = {testing},
researchr = {https://researchr.org/publication/BeckerD94},
cites = {0},
citedby = {0},
pages = {667},
booktitle = {EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France},
editor = {Robert Werner},
publisher = {IEEE Computer Society},
isbn = {0-8186-5410-4},
}