Macro Testing: Unifying IC and Board Test

Frans P. M. Beenker, Karel J. E. van Eerdewijk, Robert B. W. Gerritsen, Frank N. Peacock, Max Van der Star. Macro Testing: Unifying IC and Board Test. IEEE Design & Test of Computers, 3(6):26-32, 1986. [doi]

Abstract

Abstract is missing.