Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff. Automatic Scan Insertion and Test Generation for Asynchronous Circuits. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 804-813, IEEE Computer Society, 2002. [doi]
Abstract is missing.