Michael L. Behm, John M. Ludden, Yossi Lichtenstein, Michal Rimon, Michael Vinov. Industrial experience with test generation languages for processor verification. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 36-40, ACM, 2004. [doi]
@inproceedings{BehmLLRV04,
title = {Industrial experience with test generation languages for processor verification},
author = {Michael L. Behm and John M. Ludden and Yossi Lichtenstein and Michal Rimon and Michael Vinov},
year = {2004},
doi = {10.1145/996566.996578},
url = {http://doi.acm.org/10.1145/996566.996578},
tags = {testing},
researchr = {https://researchr.org/publication/BehmLLRV04},
cites = {0},
citedby = {0},
pages = {36-40},
booktitle = {Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004},
editor = {Sharad Malik and Limor Fix and Andrew B. Kahng},
publisher = {ACM},
isbn = {1-58113-828-8},
}