Michael L. Behm, John M. Ludden, Yossi Lichtenstein, Michal Rimon, Michael Vinov. Industrial experience with test generation languages for processor verification. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 36-40, ACM, 2004. [doi]
Abstract is missing.