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Comparative analysis of accelerated ageing effects on power RF LDMOS reliability

M. A. Belaïd, K. Ketata, K. Mourgues, H. Maanane, M. Masmoudi, J. Marcon. Comparative analysis of accelerated ageing effects on power RF LDMOS reliability. Microelectronics Reliability, 45(9-11):1732-1737, 2005. [doi]

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