J. Marcon - researchr alias

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Viewing Publication 1 - 8 from 8

2007

Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing testsM. A. Belaïd, K. Ketata, M. Gares, K. Mourgues, M. Masmoudi, J. Marcon. mr, 47(1):59-64, 2007. [doi]

Reliability study of power RF LDMOS device under thermal stressM. A. Belaïd, K. Ketata, K. Mourgues, M. Gares, M. Masmoudi, J. Marcon. mj, 38(2):164-170, 2007. [doi]

Study of hot-carrier effects on power RF LDMOS device reliabilityM. Gares, M. A. Belaïd, H. Maanane, M. Masmoudi, J. Marcon, K. Mourgues, Ph. Eudeline. mr, 47(9-11):1394-1399, 2007. [doi]

2006

Electrical parameters degradation of power RF LDMOS device after accelerated ageing testsM. A. Belaïd, K. Ketata, M. Masmoudi, M. Gares, H. Maanane, J. Marcon. mr, 46(9-11):1800-1805, 2006. [doi]

Hot carrier reliability of RF N- LDMOS for S Band radar applicationM. Gares, H. Maanane, M. Masmoudi, P. Bertram, J. Marcon, M. A. Belaïd, K. Mourgues, C. Tolant, Ph. Eudeline. mr, 46(9-11):1806-1811, 2006. [doi]

Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de PuissanceM. Gares, H. Maanane, M. A. Belaïd, M. Masmoudi, J. Marcon, K. Mourgues, P. Bertram, Ph. Eudeline. ccece 2006: 382-385 [doi]

Study of RF N:::-::: LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RFH. Maanane, M. Masmoudi, J. Marcon, M. A. Belaïd, K. Mourgues, C. Tolant, K. Ketata, Ph. Eudeline. mr, 46(5-6):994-1000, 2006. [doi]

2005

Comparative analysis of accelerated ageing effects on power RF LDMOS reliabilityM. A. Belaïd, K. Ketata, K. Mourgues, H. Maanane, M. Masmoudi, J. Marcon. mr, 45(9-11):1732-1737, 2005. [doi]

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