H. Maanane, M. Masmoudi, J. Marcon, M. A. Belaïd, K. Mourgues, C. Tolant, K. Ketata, Ph. Eudeline. Study of RF N:::-::: LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF. Microelectronics Reliability, 46(5-6):994-1000, 2006. [doi]
Abstract is missing.